AFM microscope

The AFM microscope (ParkSystem NX10) is a versatile atomic surface microscope featuring a specific tip-changing module that enables unique and reproducible alignment of each tip, for homogeneous and stable characterization of the same sample at different stages of its manufacture. This microscope is dedicated to surface characterization of two-dimensional materials.

Centre for Nanosciences and Nanotechnology (C2N), Palaiseau

Platform manager: Abdelkarim OUERGHI

Associated targeted project coordinator: Yann LECONTE


  • ParkSystem NX10 microscope
  • AFM measurement in contact and low-noise non-contact modes
  • KPFM measurement
  • Maximum sample size: approx. 10×10 mm