Operando characterization of electronic structure under electrical stress
Description
Sample holder for bias-dependent photoelectron spectroscopy analysis.
Location
CEA Saclay
Technical characteristics
- FerroVac Shomec sample holder suitable for applying reliable Vbias on up to 12 devices (capacitors, tunnel junctions, etc…), thanks to intermediate pads and interconnects integrated into the sample holder
- Compatible with the HAXPES experiment on the Galaxies line (Synchrotron Soleil) and with the XPS system at CEA/SPEC in Saclay
- Sample dimensions: 5×5 mm2
- Wire-bonding between devices and intermediate pads
Associated targeted project
MicroElec
High-throughput development and characterization of heterostructures for microelectronic applications